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Hankkija
| Vastaanotettu Hilmaan | 2019-12-31 |
| Ilmoituksen numero | 2019-016108 |
| TED numero | 2019/S 151-371952 |
| Ostajaorganisaatio | Lappeenrannan-Lahden teknillinen yliopisto LUT (0245904-2 ) Yliopistonkatu 34 FI-53850 Lappeenranta http://www.lut.fi |
| Hankinnan otsikkotiedot | X-ray diffractometer |
| Hankinnan yhteenlaskettu kokonaisarvo koko ajalle (ilman alv:ta) arvio | 242 000 EUR |
| Hankinnan yhteenlaskettu kokonaisarvo koko ajalle (ilman alv:ta) lopullinen | |
| Alkuperäinen ilmoitus | https://www.hankintailmoitukset.fi/sv/public/procurement/21872/notice/26029/overview |
| Originaali JSON tietue | 26029.json |
Ostettava
| Hankinnan lyhyt kuvaus | Contracting entity: LUT Material Physics Laboratory. Description of current state Currently, we use a line focus Empyrean diffractometer located in Mikkeli, Laboratory of Green Chemistry. The diffractometer is good for powder diffraction and for thin film sample investigations. We restricted the incident beam by masking for trying to make the point focus beam, but the divergence of the collimated beam is large in horizontal plane and is not suitable for micro beam investigations. We have also several special needs, e.g., applying a magnetic field to the sample, straining the sample and varying the temperature during the measurement. Any of these tasks is not possible to do with the current diffractometer. Description of the target state X-ray microdiffraction analysis uses a very small size X-ray beam to carry out highly localized XRD measurements of a very small area. Recently developed instrumentation and techniques can perform microdiffraction on samples as small as 20-100 μm in diameter. Essential feature of the X-ray microdiffractometer is the small diameter of the X-ray beam (Fig. A). Incident beam collimators and a high magnification video camera are used to accurately and precisely position the sample area of interest in the X-ray beam (see Fig. B). A two-dimensional detector is used to collect the entire diffraction data while reducing the number of moving axes and associated uncertainty (see Fig. C). The research field of microdiffraction is rapidly growing in materials research and fabrication, because material properties and product yield and reliability are now analyzed from smaller domains. EBSD method, widely used in SEM, has higher spatial resolution, but less accurate in orientation determination. X-ray microdiffraction can be used for characterization of the samples with structure domains as in magnetic shape memory materials, as well as for samples with high compositional gradients, contaminations, inclusions, mineralogical samples, tiny cross-sections samples, patterned wafers, micro-devices and so on. LUT Material Physics requires for investigations of the MSM materials and devices a possibility to study single crystalline samples (orientation, crystal structure) with twin boundaries and the crystallographic domains (variants) oriented differently. Suitable diffractometer for such investigations should have X-ray tube with a point focus, three-axes sample stage rotation and x-y table. The equipment to be purchased forms the basis for the research of our laboratory. The equipment will be used also teaching and exercises. It else helps us attract foreign researchers to work in LUT. A description of the purchase is attached as Appendix 1 |
| Hankintanimikkeistö (CPV) pää | |
| Hankintanimikkeistö (CPV) muut | |
| Aluekoodi | FI1C5 |
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Sopimukset
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