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                "Justification for the direct purchase. The justification must be based on one of the preconditions mentioned in the procurement act (1397\/2016).( 40\u00a7, 41\u00a7, 110\u00a7, 119\u00a7). 40\u00a7 2) only a certain supplier can implement the procurement for a technical reason, or for a reason related to protecting an exclusive right. ",
                "",
                "EPMA device delivers a non-destructive technique used for quantitative chemical analysis and mapping of elements in solid natural and artificial materials. It is primarily used to acquire precise, quantitative analysis at small \u201cspot\u201d sizes (up to 1-2 microns) by wavelength dispersive spectroscopy (WDS). The small spatial scale achievable combined with the ability to create high resolution compositional images of the sample it is possible to study natural, geological and environmental samples in situ and resolve chemical variations within single phases. ",
                "",
                "EPMA needs to meet a variety of research requirements including high resolution and sensitivity for trace to major elements and accommodate a variety of sample sizes. ",
                "",
                "General research requirements are as follows: ",
                "\u2022 Electron microprobe analyser with an electron column equipped with a LaB6 source ",
                "\u2022 EDS detector ",
                "\u2022 Cathodoluminescence detector ",
                "\u2022 Crystal configuration suitable for geoscientific applications with flexibility for other disciplines ",
                "\u2022 Spectrometer with small Rowland circle optimized for high count rate ",
                "\u2022 Sample Stage with large range of movement and depth to take multiple samples and a range of ",
                "sample sizes (~8x8x5cm) ",
                "\u2022 Split holder system to enable standards to remain in the instrument ",
                "\u2022 SE resolution: 2.5nm, ",
                "\u2022 Resolution at Analytical Condition 10kV, 10nA: 20nm ",
                "\u2022 Resolution at Analytical Condition 10kV, 100nA: 50nm ",
                "\u2022 Probe Current Stability: \u00b10.3% \/ h and \u00b11% \/ 12 h ",
                "\u2022 EDS with \u201clive\u201d functionality ",
                "\u2022 EDS maps: more than 8 elements possible ",
                "\u2022 Simultaneous acquisition of more than 2 detector signals ",
                "\u2022 Plasma Cleaner at airlock ",
                "\u2022 Stage Navigation System, or Point logging system ",
                "\u2022 Probe Current up to 3 \u00b5A ",
                "\u2022 Dry pump for oil free operation ",
                "\u2022 Water cooler ",
                "\u2022 Back-up power kit ",
                "\u2022 Suitable software for Geological applications and Mapping ",
                "\u2022 Small footprint to fit into designated laboratory space",
                "",
                "Only two manufactures globally are providing EPMA instruments to this level: Cameca (France) and JEOL (Japan). None of the other manufacturer\u2019s devices meet the research requirements for resolution and functionality. ",
                "",
                "\u2022 While both manufactures instruments are comparable in their basic workings (i.e., resolution, stability, functionality), only the JEOL JXAiHP200f has a large enough sample chamber with corresponding range of movement to hold large samples (up to 50mm in height), while the Cameca SXFive-TACTIS sample chamber has a maximum sample height of 20mm which is not sufficient for archaeological samples. ",
                "\u2022 JEOL JXAiHP200f is also the only instrument with a spectrometer configuration with a small Rowland circle for high count rates to enable better analysis of lower elemental concentrations. ",
                "\u2022 JEOL spectrometers are also windowless, giving increased sensitivity to the detectors. ",
                "",
                "JEOL JXAiHP200f is the only device on the market that meet the research requirements."
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